Ellis DS,Weschke E,Kay A,Grave DA,Malviya KD,Mor H,de Groot FMF,Dotan H,Rothschild A
Ansari N,Ulman K,Camellone MF,Seriani N,Gebauer R,Piccinin S
Nguyen KX,Huang J,Karigerasi MH,Kang K,Cahill DG,Zuo J-M,Schleife A,Shoemaker DP,Huang PY
Ultramicroscopy
Venkatraman K,Hachtel JA,Chi M
Matter 2022; volume 5: issue 8:2414-2416
Smith TT
Physical Review 1916; volume 8: issue 6:721-737
Grave DA,Yatom N,Ellis DS,Toroker MC,Rothschild A
Advanced Materials 2018; volume 30: issue 41:1706577
Pauling L,Hendricks SB
Journal of the American Chemical Society 1925; volume 47: issue 3:781-790
Morin FJ
Krén E,Szabó P,Konczos G
Physics Letters 1965; volume 19: issue 2:103-104
NIST
Blundell Stephen
Shifrin VY,Khorev VN,Kalabin VN,Voronov SL,Shilov AE
Measurement Techniques 2012; volume 55: issue 7:739-744
所有学科
浙公网安备 33010202000686号 ( 浙ICP备09035230号-1 )
