Lu X,Kataria S,Brouwer WJ,Wang JZ,Mitra P,Giles CL
International Journal on Document Analysis and Recognition (IJDAR) 2009; volume 12: issue 2:65-81
Writer, Beta
Flusser J,Farokhi S,Hoschl C,Suk T,Zitova B,Pedone M
IEEE Transactions on Image Processing 2016; volume 25: issue 2:790-806
Pech-Pacheco JL,Cristobal G,Chamorro-Martinez J,Fernandez-Valdivia J
Stanev V,Oses C,Kusne AG,Rodriguez E,Paglione J,Curtarolo S,Takeuchi I
npj Computational Materials 2018; volume 4: issue 1
Bochkovskiy A,Wang C-Y,Liao H-YM
Bureau International des Poids et Mesures (BIPM)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
Zieba A,Foner S
Review of Scientific Instruments 1983; volume 54: issue 2:137-145
Michels WC,Curtis NL
Review of Scientific Instruments 1941; volume 12: issue 9:444-447
Bellescize H. de
M. L. Meade
Othman MAK,Galdi V,Capolino F